Impurity-concentration dependence of seebeck coefficient in silicon-on-insulator layers
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22.01.2013
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Salleh, F., Asai, K., Ischida, A., & Ikeda, H. (2013). Impurity-concentration dependence of seebeck coefficient in silicon-on-insulator layers. Journal of Automation, Mobile Robotics and Intelligent Systems, 3(4), 134-136. https://www.jamris.org/index.php/JAMRIS/article/view/68
How to Cite
Salleh, F., Asai, K., Ischida, A., & Ikeda, H. (2013). Impurity-concentration dependence of seebeck coefficient in silicon-on-insulator layers. Journal of Automation, Mobile Robotics and Intelligent Systems, 3(4), 134-136. https://www.jamris.org/index.php/JAMRIS/article/view/68
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