ZnO films: properties determined by electronic microscopy and ellipsometry
Authors
Downloads
Published
22.01.2013
Issue
Section
Articles
How to Cite
Rakov, M., Poperenko, L., Tkach, V., & Yurgelevich, I. (2013). ZnO films: properties determined by electronic microscopy and ellipsometry. Journal of Automation, Mobile Robotics and Intelligent Systems, 3(4), 112-114. https://www.jamris.org/index.php/JAMRIS/article/view/61