ZnO films: properties determined by electronic microscopy and ellipsometry

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Published

22.12.2009

Issue

ISSUE 04/2009

Section

Articles

How to Cite

Rakov, M., Poperenko, L., Tkach, V., & Yurgelevich, I. (2009). ZnO films: properties determined by electronic microscopy and ellipsometry. Journal of Automation, Mobile Robotics and Intelligent Systems, 3(4), 112-114. https://www.jamris.org/index.php/JAMRIS/article/view/61