ZnO films: properties determined by electronic microscopy and ellipsometry

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Published
22.01.2013
Issue
ISSUE 04/2009
Section
Articles

How to Cite

Rakov, M., Poperenko, L., Tkach, V., & Yurgelevich, I. (2013). ZnO films: properties determined by electronic microscopy and ellipsometry. Journal of Automation, Mobile Robotics and Intelligent Systems, 3(4), 112-114. https://www.jamris.org/index.php/JAMRIS/article/view/61
How to Cite
Rakov, M., Poperenko, L., Tkach, V., & Yurgelevich, I. (2013). ZnO films: properties determined by electronic microscopy and ellipsometry. Journal of Automation, Mobile Robotics and Intelligent Systems, 3(4), 112-114. https://www.jamris.org/index.php/JAMRIS/article/view/61

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