An XPS study of RF sputtered Ti1-xFexO2 thin films

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Published
22.01.2013
Issue
ISSUE 04/2009
Section
Articles

How to Cite

Luca, D., Apetrei, R., Dobromir, M., Dascaleanu, V., & Teodorescu, C.-M. (2013). An XPS study of RF sputtered Ti1-xFexO2 thin films. Journal of Automation, Mobile Robotics and Intelligent Systems, 3(4), 15-17. https://www.jamris.org/index.php/JAMRIS/article/view/34
How to Cite
Luca, D., Apetrei, R., Dobromir, M., Dascaleanu, V., & Teodorescu, C.-M. (2013). An XPS study of RF sputtered Ti1-xFexO2 thin films. Journal of Automation, Mobile Robotics and Intelligent Systems, 3(4), 15-17. https://www.jamris.org/index.php/JAMRIS/article/view/34

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