SALLEH, Faiz; ASAI, Kiyosumi; ISCHIDA, Akihiro; IKEDA, Hiroya. Impurity-concentration dependence of seebeck coefficient in silicon-on-insulator layers. Journal of Automation, Mobile Robotics and Intelligent Systems, [S. l.], v. 3, n. 4, p. 134–136, 2013. Disponível em: https://www.jamris.org/index.php/JAMRIS/article/view/68. Acesso em: 19 jan. 2025.