RAKOV, Mykhailo; POPERENKO, Leonid; TKACH, Vasyl; YURGELEVICH, Iryna. ZnO films: properties determined by electronic microscopy and ellipsometry. Journal of Automation, Mobile Robotics and Intelligent Systems, [S. l.], v. 3, n. 4, p. 112–114, 2009. Disponível em: https://www.jamris.org/index.php/JAMRIS/article/view/61. Acesso em: 9 may. 2025.